Monday, November 19, 2007

Scandisk Recruits Freshers

Designation Test Engineer I

Job Description

Tasks to be performed & areas of responsibility (include physical aspects of the job):

Test program development and debug

oCreate or modify Memory test program on NexTest tester
oCreate or modify Burn-In test program on STK BI oven
oDebug and trouble shoot test program for low yield lot with Product Engineer
oSupport production issues related to test time out error and Operator Interface error
oNew test platform conversion
oSupport test time reduction activities

Test Program correlation/production release

oNew test program verification and correlation
oSupport test program for equipment correlation
oSupport new subcontractor qualification

Documentation

oGenerate Test Change Notice and Test Change Request
oDeviation generation and release for urgent test program release
oIssue Test Engineering Change Notice for test program correlation
oMaintain and update test time table

Must be able to work with different Engineering groups to communicate technical issues and must drive for results.
You would be expected to perform experiments to get to root cause of issues and to evaluate potential solutions.

Education Requirements/Preference:

This position requires BSEE, BSCE, MSEE or equivalent experience.

Years Experience :

0-2 years experience with Integrated Circuit manufacturing. Flash Memory experience would be a plus.
Courses taken in computer science and Integrated Circuit are a must
Experience on high volume manufacturing and yield improvement.
Experience with Memory Tester is a plus.
Must have good interpersonal skills and be able to work with manufacturing to achieve results.
English fluency is a must both in oral and written format.

Experience 0 - 2

Industry Type Semiconductors/ Electronics

Functional Area Embedded/EDA /VLSI/ASIC/Chip Design

Education

UG - B.Sc - Computers, Electronics;B.Tech/B.E. - Computers, Electrical, Electronics/Telecomunication
PG - M.Sc - Computers, Electronics;M.Tech - Computers, Electrical, Electronics/Telecomunication

Location China

Keywords Integrated Circuit , Flash Memory

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